Bibtex de la publication

@InProceedings{ Pa2012.19,
author = {Patraucean, Viorica and Gurdjos, Pierre and Grompone Von Gioi, Rafael},
title = "{A Parameterless Line Segment and Elliptical Arc Detector with Enhanced Ellipse Fitting (regular paper)}",
booktitle = "{European Conference on Computer Vision (ECCV), Florence (Italie), 08/10/12-11/10/12}",
year = {2012},
month = {octobre},
publisher = {Springer},
address = {http://www.springerlink.com},
volume = {2},
pages = {572--585},
language = {anglais},
URL = {http://ubee.enseeiht.fr/vision/ELSD/eccv2012-ID576.pdf},
keywords = {ellipse detection, a contrario approach, ellipse},
note = {code available at http://ubee.enseeiht.fr/vision/ELSD/},
abstract = {We propose a combined line segment and elliptical arc detec- tor, which formally guarantees the control of the number of false positives and requires no parameter tuning. The accuracy of the detected elliptical features is improved by using a novel non-iterative ellipse tting tech- nique, which merges the algebraic distance with the gradient orientation. The performance of the detector is evaluated on computer-generated im- ages and on natural images.}
}